a - 2005 12 - oct luy22840/s8 ligitek electronics co.,ltd. property of ligitek only luy22840/s8 data sheet doc. no : qw0905- rev. : date : super bright oval type led lamps
1/4 page luy22840/s8 part no. ligitek electronics co.,ltd. property of ligitek only package dimensions note : 1.all dimension are in millimeter tolerance is ? 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. directivity radiation 6.3 4.0 2.54typ 1.0min 25.0min ?? 0.5 typ 3.8 1.5max 9.6 ? 0.5 + - radiation angle(0.5):h 80 degree/v 120 degree -60 x 50% 100% 75% 25% 0 25% -30 x vertical axis 120 x 0 x 60 x 75% 50% 100% 30 x horizontal axis 80 x 1.30.1
yellow diffused color lens algainp material luy22840/s8 part no yellow emitted 200 luminous intensity @20ma(mcd) typ. 15 spectral halfwidth ??f nm 595 dominant wave length f dnm 2.6 max. forward voltage @ ma(v) 1.7 min. 20 120 min. viewing angle 2 c 1/2 (deg) 2/4 page ligitek electronics co.,ltd. property of ligitek only unit ma ma g a j v j mw 50 90 uy ratings 10 2000 ir -40 ~ +85 max 260 j for 5 sec max (2mm from body) -40 ~ +100 120 part no. luy22840/s8 forward current peak forward current duty 1/10@10khz parameter operating temperature soldering temperature storage temperature electrostatic discharge reverse current @5v power dissipation typical electrical & optical characteristics (ta=25 j ) symbol esd tsol t opr tstg i f pd i fp absolute maximum ratings at ta=25 j note : 1.the forward voltage data did not including ? 0.1v testing tolerance. 2. the luminous intensity data did not including ? 15% testing tolerance. horizontal axis 80 x vertical axis 120 x
ambient temperature( j ) fig.4 relative intensity vs. temperature relative intensity @20ma wavelength (nm) 500 0 0.5 550 600 650 ambient temperature( j ) fig.5 relative intensity vs. wavelength fig.3 forward voltage vs. temperature forward voltage@20ma normaliz @25 j -20 1.0 -40 0.8 20 060 40 1.0 0.9 1.1 1.2 0.5 relative intensity @20ma normalize @25 j 100 80 -40 -20 0 020 3.0 2.5 2.0 1.5 1.0 80 60 40 100 ligitek electronics co.,ltd. property of ligitek only fig.2 relative intensity vs. forward current forward current(ma) 4.0 fig.1 forward current vs. forward voltage typical electro-optical characteristics curve 100 forward current(ma) 0.1 1.0 10 1.0 forward voltage(v) 2.0 3.0 1000 uy chip relative intensity normalize @20ma 2.0 1.5 1.0 0.5 5.0 0 1.0 10 3.0 2.5 page 3/4 100 1000 part no. luy22840/s8
part no. luy22840/s8 page 4/4 ligitek electronics co.,ltd. property of ligitek only reference standard mil-std-883:1008 jis c 7021: b-10 jis c 7021: b-12 mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 description test condition test item reliability test: 1.ta=105 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. 1.ta=-40 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) the purpose of this is the resistance of the device which is laid under ondition of high temperature for hours. low temperature storage test high temperature storage test 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, + 72hrs) operating life test this test is conducted for the purpose of detemining the resisance of a part in electrical and themal stressed. mil-std-202:103b jis c 7021: b-11 mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 1.ta=65 j? 5 j 2.rh=90 %~95% 3.t=240hrs ? 2hrs 1.t.sol=260 j? 5 j 2.dwell time= 10 ? 1sec. 1.ta=105 j? 5 j &-40 j? 5 j (10min) (10min) 2.total 10 cycles the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. solder resistance test thermal shock test high temperature high humidity test 1.t.sol=230 j? 5 j 2.dwell time=5 ? 1sec solderability test this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. the purpose of this test is the resistance of the device under tropical for hous. this test intended to see soldering well performed or not.
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